Unique determination of multiple cracks by two measurements

SIAM Journal on Control and Optimization

Volumn 34, Issue 3, 1996, Pages 913-921

  Alessandrini, Giovanni ^a   Diaz Valenzuela, Alvaro ^b  

^a UNIVERSITY OF TRIESTE   (Italy)

^b Providencia 2457 ^*  (Chile)

Author keywords

Cracks; Elliptic equations; Inverse problems; Level curves

Indexed keywords

COMPOSITE MATERIALS; CRACKS; ELECTRIC CONDUCTIVITY; ELECTRIC CONDUCTORS; ELECTRIC CURRENTS;

ELLIPTIC EQUATIONS; LEVEL CURVES;

INVERSE PROBLEMS;

EID: 0030151922     PISSN: 03630129     EISSN: None     Source Type: Journal    
DOI: 10.1137/S0363012994262853     Document Type: Article

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