Pulsed-current duty cycle dependence of electromigration-induced stress generation in aluminum conductors

IEEE Electron Device Letters

Volumn 17, Issue 5, 1996, Pages 244-246

  Frankovic, Richard ^a,b   Bernstein, Gary H ^a,b   Clement, J Joseph ^c  

^a IEEE

^b UNIVERSITY OF NOTRE DAME   (United States)

^c HEWLETT PACKARD COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; CURRENT DENSITY; ELECTRIC CONDUCTORS; ELECTRIC RESISTANCE; ELECTRIC VARIABLES MEASUREMENT; INTEGRATED CIRCUITS; SCANNING ELECTRON MICROSCOPY; STRESSES;

ALUMINUM CONDUCTORS; BLECH LENGTHS; DUTY CYCLE; EDGE DISPLACEMENT TECHNIQUE; PULSED CURRENTS;

ELECTROMIGRATION;

EID: 0030151749     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/55.491843     Document Type: Article

References (14)

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