Dielectric constant characterization of large-area substrates in millimeter wave band

International Journal of Infrared and Millimeter Waves

Volumn 17, Issue 5, 1996, Pages 819-831

  Cherpak, N T ^a   Izhyk, E V ^a   Kirichenko, A Ya ^a   Kosmyna, M B ^b   Velichko, A V ^a  

^a A USIKOV INSTITUTE OF RADIO PHYSICS AND ELECTRONICS   (Ukraine)

^b INSTITUTE FOR SINGLE CRYSTALS   (Ukraine)

Author keywords

Dielectric resonator; Dielectric substrates; High temperature superconducting films; Millimeter wave measurement; Permittivity

Indexed keywords

ELECTRIC FREQUENCY MEASUREMENT; HIGH TEMPERATURE SUPERCONDUCTORS; MEASUREMENT ERRORS; MILLIMETER WAVES; OPTICAL RESONATORS; OXIDE SUPERCONDUCTORS; SINGLE CRYSTALS; SUBSTRATES; THIN FILMS;

CHEMICAL STABILITY; DIELECTRIC SUBSTRATES; MILLIMETER WAVE MEASUREMENT; QUASIOPTICAL DIELECTRIC RESONATOR;

PERMITTIVITY;

EID: 0030151617     PISSN: 01959271     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02101390     Document Type: Article

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