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Volumn 47, Issue 5, 1996, Pages 421-424
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Preferential sputtering and surface binding energy in metal silicides
a b a |
Author keywords
[No Author keywords available]
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Indexed keywords
AUGER ELECTRON SPECTROSCOPY;
BINDING ENERGY;
INTERFACIAL ENERGY;
ION BOMBARDMENT;
SPUTTERING;
METAL SILICIDES;
PREFERENTIAL SPUTTERING;
SPUTTERING YIELD RATIOS;
SILICON ALLOYS;
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EID: 0030151572
PISSN: 0042207X
EISSN: None
Source Type: Journal
DOI: 10.1016/0042-207X(96)00002-4 Document Type: Article |
Times cited : (7)
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References (25)
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