An efficient method for determining threshold voltage, series resistance and effective geometry of MOS transistors

IEEE Transactions on Semiconductor Manufacturing

Volumn 9, Issue 2, 1996, Pages 215-222

  Karlsson, Peter R ^b   Jeppson, Kjell O ^a,b  

^a IEEE

^b CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

CONVERGENCE OF NUMERICAL METHODS; DIFFERENTIATION (CALCULUS); ELECTRIC RESISTANCE MEASUREMENT; ITERATIVE METHODS; LEAST SQUARES APPROXIMATIONS; NONLINEAR EQUATIONS; OPTIMIZATION; PROCESS CONTROL; REGRESSION ANALYSIS; RESISTORS; SEMICONDUCTOR DEVICE MODELS; VOLTAGE MEASUREMENT;

EFFECTIVE GEOMETRY; PARAMETER EXTRACTION; SERIES RESISTANCE; THRESHOLD VOLTAGE;

MOSFET DEVICES;

EID: 0030151214     PISSN: 08946507     EISSN: None     Source Type: Journal    
DOI: 10.1109/66.492815     Document Type: Article

References (13)

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