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Volumn 31, Issue 5, 1996, Pages 445-452
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Dielectric and crystallographic study of the lead magnotantalate relaxor
a a a |
Author keywords
A. Oxides; A: Ceramics; C. X ray diffraction; D. Dielectric properties
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Indexed keywords
CERAMIC MATERIALS;
CRYSTAL STRUCTURE;
DIELECTRIC PROPERTIES OF SOLIDS;
DIELECTRIC RELAXATION;
ELECTRIC FIELDS;
ELECTRIC VARIABLES MEASUREMENT;
FERROELECTRIC MATERIALS;
NUCLEATION;
PERMITTIVITY;
PEROVSKITE;
TEMPERATURE;
X RAY CRYSTALLOGRAPHY;
CLUSTER NUCLEATION TEMPERATURE;
DIELECTRIC MEASUREMENTS;
LEAD MAGNOTANTALATE RELAXOR;
LIQUID NITROGEN TEMPERATURE;
VOGEL FULCHER BEHAVIOR;
LEAD COMPOUNDS;
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EID: 0030151191
PISSN: 00255408
EISSN: None
Source Type: Journal
DOI: 10.1016/S0025-5408(96)00026-8 Document Type: Article |
Times cited : (37)
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References (19)
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