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Volumn 44, Issue 5, 1996, Pages 2127-2143

Formation of misfit dislocations with in-plane Burgers vectors in boron diffused (111) silicon

Author keywords

[No Author keywords available]

Indexed keywords

BORON; CRYSTAL DEFECTS; DISLOCATIONS (CRYSTALS); SILICON; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0030150259     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/1359-6454(95)00295-2     Document Type: Article
Times cited : (3)

References (29)
  • 1
    • 0024766321 scopus 로고
    • See e.g., W. Nix, Metall. Trans. 20A, 2217 (1989).
    • (1989) Metall. Trans. , vol.20 A , pp. 2217
    • Nix, W.1
  • 8
    • 0026360408 scopus 로고
    • (edited by A. G. Cullis), Series No. 117, Inst. Phys. Conf. Oxford, England
    • X. J. Ning and P. Pirouz, in Microscopy of Semiconducting Materials (edited by A. G. Cullis), Series No. 117, p. 205. Inst. Phys. Conf. Oxford, England (1991).
    • (1991) Microscopy of Semiconducting Materials , pp. 205
    • Ning, X.J.1    Pirouz, P.2
  • 25
    • 0002902326 scopus 로고
    • (edited by F. R. N. Nabarro), North-Holland, Amsterdam
    • S. Amelinckx, in Dislocations in Solids (edited by F. R. N. Nabarro), Vol. 2, p. 67. North-Holland, Amsterdam (1979).
    • (1979) Dislocations in Solids , vol.2 , pp. 67
    • Amelinckx, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.