Scattering by random particles on optical surfaces

Applied Optics

Volumn 35, Issue 13, 1996, Pages 2292-2303

  Bruno, W M ^a   Bessey, J S ^a   Whitesmith, P M ^a   Burke, P E ^a  

^a NORTHROP GRUMMAN CORPORATION   (United States)

Author keywords

Bidirectional reflectance distribution function; Optical surfaces; Particulate contaminants

Indexed keywords

ASPECT RATIO; DIELECTRIC MATERIALS; ELECTRIC FIELDS; IMAGE ANALYSIS; IMPURITIES; LIGHT REFLECTION; MATHEMATICAL MODELS; OPTICAL VARIABLES MEASUREMENT; PARTICLE SIZE ANALYSIS; SCANNING ELECTRON MICROSCOPY; SURFACES;

BIDIRECTIONAL REFLECTANCE DISTRIBUTION FUNCTION; IMAGE ANALYZER; MULTILAYER DIELECTRIC COATINGS; OPTICAL SURFACES; PARTICULATE CONTAMINANTS;

LIGHT SCATTERING;

EID: 0030150193     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.35.002292     Document Type: Article

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