Estimation of low temperature characteristics of JFETs from their room-temperature characteristics

Cryogenics

Volumn 36, Issue 5, 1996, Pages 325-331

  Sreelakshmi, K ^a   Satyam, M ^a  

^a INDIAN INSTITUTE OF SCIENCE   (India)

Author keywords

Characteristics; JFETs; Low temperature; Room temperature

Indexed keywords

CRYOGENICS; ELECTRIC VARIABLES MEASUREMENT; ESTIMATION; HYBRID INTEGRATED CIRCUITS; INTEGRATED CIRCUIT LAYOUT; LOW TEMPERATURE PROPERTIES; SEMICONDUCTOR DEVICE TESTING;

BREAKDOWN VOLTAGE; DRAIN CURRENT; PINCH-OFF VOLTAGE; ROOM TEMPERATURE;

JUNCTION GATE FIELD EFFECT TRANSISTORS;

EID: 0030150121     PISSN: 00112275     EISSN: None     Source Type: Journal    
DOI: 10.1016/0011-2275(96)81102-7     Document Type: Article

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