Subsurface defect detection in ceramics using an optical gated scatter reflectometer

Journal of the American Ceramic Society

Volumn 79, Issue 5, 1996, Pages 1397-1400

  Bashkansky, Mark ^a   Battle, Phillip R ^a,c   Duncan, Michael D ^a   Kahn, Manfred ^a,b,d   Reintjes, J ^a,d  

^a NAVAL RESEARCH LABORATORY   (United States)

^b AMERICAN CERAMIC SOCIETY   (United States)

^c UNITED STATES NAVAL ACADEMY   (United States)

^d Code 6382 ^*

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; OPTICAL PROPERTIES; OPTICAL TESTING; SILICON NITRIDE;

OPTICAL GATING TECHNIQUE; SUBSURFACE DEFECTS DETECTION;

CERAMIC MATERIALS;

EID: 0030149815     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.1996.tb08602.x     Document Type: Article

References (11)

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