Modeling the Yule-Nielsen halftone effect

Journal of Imaging Science and Technology

Volumn 40, Issue 3, 1996, Pages 233-238

  Arney, J S ^a,c   Arney, Charles D ^a   Engeldrum, P G ^b,c  

^a ROCHESTER INSTITUTE OF TECHNOLOGY   (United States)

^b Imcotek   (United States)

^c IS and T ^*

Author keywords

[No Author keywords available]

Indexed keywords

INK; LIGHT REFLECTION; MATHEMATICAL MODELS; NONLINEAR OPTICS; PRINTING;

HALFTONE IMAGE; HALFTONE LINE SYSTEM; INK PENETRATION; MACROSCOPIC REFLECTANCE; MICRODENSITOMETRIC ANALYSIS; MURRAY-DAVIES EQUATION; OPTICAL DOT GAIN; YULE-NIELSEN HALFTONE EFFECT;

IMAGING TECHNIQUES;

EID: 0030149568     PISSN: 10623701     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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