Characterisation of buried lateral period superlattices by ballistic electron emission microscopy

Surface Science

Volumn 352-354, Issue , 1996, Pages 802-806

  Westwood, D I ^a   Ke, M L ^a   Lelarge, F ^b   Laruelle, F ^b   Etienne, B ^b  

^a CARDIFF UNIVERSITY   (United Kingdom)

^b CNRS   (France)

Author keywords

Ballistic electron emission microscopy (BEEM); Scanning tunneling microscopy; Semiconducting surfaces; Superlattices; Vicinal single crystal surfaces

Indexed keywords

CHARACTERIZATION; ELECTRON MICROSCOPY; GOLD; MOLECULAR BEAM EPITAXY; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE; SINGLE CRYSTALS; SURFACES; THIN FILMS;

BALLISTIC ELECTRON EMISSION MICROSCOPY; BURIED LATERAL PERIOD SUPERLATTICES; LOCAL POTENTIAL BARRIER HEIGHT VARIATIONS; SEMICONDUCTING SURFACES; VICINAL SINGLE CRYSTAL SURFACES;

SEMICONDUCTOR SUPERLATTICES;

EID: 0030149368     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(95)01279-6     Document Type: Article

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