|
Volumn 352-354, Issue , 1996, Pages 875-878
|
X-ray characterization of a SrTiO3 bicrystal interface
|
Author keywords
Bicrystal interfaces; Grain boundaries; Strontium titanate; Surface structure, morphology, roughness, and topography; X ray scattering, diffraction, and reflection
|
Indexed keywords
CHARACTERIZATION;
CRYSTAL ATOMIC STRUCTURE;
CRYSTALS;
GRAIN BOUNDARIES;
INTERFACES (MATERIALS);
MORPHOLOGY;
REFLECTION;
SCATTERING;
STRONTIUM COMPOUNDS;
SURFACE ROUGHNESS;
X RAY DIFFRACTION;
BICRYSTAL;
BICRYSTAL INTERFACES;
CRYSTAL TRUNCATION ROD SCATTERING;
STRONTIUM TITANATE;
TOPOGRAPHY;
X RAY SCATTERING;
SURFACE STRUCTURE;
|
EID: 0030148671
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/0039-6028(95)01291-5 Document Type: Article |
Times cited : (8)
|
References (10)
|