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Volumn 352-354, Issue , 1996, Pages 875-878

X-ray characterization of a SrTiO3 bicrystal interface

Author keywords

Bicrystal interfaces; Grain boundaries; Strontium titanate; Surface structure, morphology, roughness, and topography; X ray scattering, diffraction, and reflection

Indexed keywords

CHARACTERIZATION; CRYSTAL ATOMIC STRUCTURE; CRYSTALS; GRAIN BOUNDARIES; INTERFACES (MATERIALS); MORPHOLOGY; REFLECTION; SCATTERING; STRONTIUM COMPOUNDS; SURFACE ROUGHNESS; X RAY DIFFRACTION;

EID: 0030148671     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(95)01291-5     Document Type: Article
Times cited : (8)

References (10)
  • 10
    • 30244472253 scopus 로고    scopus 로고
    • note
    • Recent experiments, which we carried out during the publication process of the present paper, indicated that the (103) (top) surface of the thin crystal may exhibit a more complicated structure, possibly influencing the truncation rod shown in Fig. 3.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.