Structure of the Stranski-Krastanov layer in surfactant-mediated Sb/Ge/Si(111) epitaxy

Surface Science

Volumn 351, Issue 1-3, 1996, Pages

  Voigtländer, Bert ^a   Zinner, André ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

Antimony; Epitaxy; Germanium; Scanning tunneling microscopy; Silicon; Surface relaxation and reconstruction; Surface stress; Surface structure; Surface thermodynamics

Indexed keywords

CRYSTAL SYMMETRY; EPITAXIAL GROWTH; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING ANTIMONY; SEMICONDUCTING GERMANIUM; SEMICONDUCTING SILICON; SEMICONDUCTOR GROWTH; STACKING FAULTS; SURFACE ACTIVE AGENTS; SURFACE STRUCTURE; THERMAL EFFECTS; THERMODYNAMICS;

ISLANDING; STRANSKI KRASTANOV LAYER; SURFACE RECONSTRUCTION; SURFACE RELAXATION;

SEMICONDUCTING FILMS;

EID: 0030148475     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(95)01098-X     Document Type: Article

References (23)

1. U. Köhler, O. Jusko, G. Pietsch, B. Müller and M. Henzler, Surf. Sci. 248 (1991) 321.
2. B. Voigtländer and A. Zinner, Appl. Phys. Lett. 63 (1993) 3055.
3. M. Copel, M.C. Reuter, E. Kaxiras and R.M. Tromp, Phys. Rev. Lett. 63 (1989) 632.
4. M. Horn-Von Hoegen, F.K. LeGoues, M. Copel, M.C. Reuter and R.M. Tromp, Phys. Rev. Lett. 67 (1991) 1130; F.K. LeGoues, M. Horn-Von Hoegen, M. Copel and R.M. Tromp, Phys. Rev. B 44 (1991) 12894.
5. M. Horn-Von Hoegen, F.K. LeGoues, M. Copel, M.C. Reuter and R.M. Tromp, Phys. Rev. Lett. 67 (1991) 1130; F.K. LeGoues, M. Horn-Von Hoegen, M. Copel and R.M. Tromp, Phys. Rev. B 44 (1991) 12894.
6. M. Horn-Von Hoegen, A. Al Falou, H. Pietsch, B.H. Müller and M. Henzler, Surf. Sci. 284 (1993) 53.
7. G. Meyer, B. Voigtländer and N.M. Amer, Surf. Sci. 272 (1992) L541.
8. B. Voigtländer and A. Zinner, J. Vac. Sci. Technol. A 12 (1994) 1932.
9. R.M. Tromp and M.C. Reuter, Phys. Rev. Lett. 68 (1992) 954.
10. J. Massies and N. Grandjean, Phys. Rev. B 48 (1993) 8502.
11. C. Snyder, B.G. Orr, D. Kessler and L.M. Sander, Phys. Rev. Lett. 66 (1991) 3032.
12. B. Voigtländer and A. Zinner, Surf. Sci. 292 (1993) L775.
13. P. Mårtenson, G. Meyer, N.M. Amer, E. Kaxiras and K.C. Pandey, Phys. Rev. B 42 (1990) 7230.
14. This (6√3 × 6√3)R30° structure was also observed by low energy electron diffraction (LEED); B. Voigtländer, unpublished.
15. D.M. Chen, J.A. Golovchenko, B. Bedrossian and K. Mortensen, Phys. Rev. Lett. 61 (1988) 2867.
16. Sang-il Park, J. Nogami and C.F. Quate, J. Microsc. 152 (1988) 727.
17. B. Voigtländer, unpublished.
18. S.L. Surnev, J. Kraft and F.P. Netzer, J. Vac. Sci. Technol. A 13 (1995) 1389.
19. M. Böhringer and J. Zegenhagen, Surf. Sci. 327 (1995) 248.
20. R.S. Becker, J.A. Golovchenko and B.S. Swartzentruber, Phys. Rev. B 32 (1985) 8455.
21. D. Vanderbilt, in: The Structure of Surfaces II, Eds. J.F. van der Veen and M.A. Van Hove (Springer, New York, 1988) p. 276.
22. E.G. McRae, Surf. Sci. 163 (1985) L766.
23. Handbook of Chemistry and Physics, 59th (CRC Press, Boca Raton, FL, 1978).