Surface-enhanced Raman spectroscopy as an in-situ real-time probe of no reduction over rhodium at high gas pressures

Chemical Engineering Science

Volumn 51, Issue 10, 1996, Pages 1673-1682

  Williams, Christopher T ^a   Tolia, Anish A ^a   Weaver, Michael J ^a   Takoudis, Christos G ^a  

^a PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; CARBON MONOXIDE; CHARGE COUPLED DEVICES; HYDROGEN; MASS SPECTROMETRY; NITROGEN OXIDES; OXIDATION; PROBES; REACTION KINETICS; REDUCTION; RHODIUM; SURFACES;

CHARGE COUPLED DEVICE DETECTOR; NITRIC OXIDE; REAL TIME MEASUREMENT; SURFACE ENHANCED RAMAN SPECTROSCOPY; SURFACE REACTION INTERMEDIATES;

RAMAN SPECTROSCOPY;

EID: 0030148293     PISSN: 00092509     EISSN: None     Source Type: Journal    
DOI: 10.1016/0009-2509(96)00026-7     Document Type: Article

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