Miniaturization of an electron device using inverse problem methodology

IEEE Transactions on Magnetics

Volumn 32, Issue 3 PART 2, 1996, Pages 1290-1293

  Arkadan, A A ^a   Subramaniam Sivanesan, S ^a  

^a Opus College of Engineering   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY CONDITIONS; BOUNDARY VALUE PROBLEMS; CARRIER CONCENTRATION; DESIGN; ELECTRIC FIELDS; FINITE ELEMENT METHOD; MOSFET DEVICES; PERMITTIVITY; SEMICONDUCTOR DEVICE MANUFACTURE; SENSITIVITY ANALYSIS; THERMODYNAMIC STABILITY;

BREAKDOWN EFFECTS; ELECTRON DEVICE MINIATURIZATION;

INVERSE PROBLEMS;

EID: 0030148097     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.497481     Document Type: Article

References (9)

1. Singh, Jasprit, Semiconductor Devices: An Introduction, McGraw-Hill, Inc., 1994.
2. Yang, Edward S., Microelectronic Devices, McGraw-Hill, Inc., 1988.
3. Hoole, S. Ratnajeevan H., Computer Aided Analysis and Design of Electromagnetic Devices, Eisevier New York, 1989.
4. Selberherr, Siegfried, Analysis and Simulation of Semiconductor Devices, Springer-Verlag: Wien, New York, 1984.
5. Markowich, Peter A., The Stationary Semiconductor Device Equations in Selderherr, S. ed. Computational Microelectronics, Springer-Verlag: Wien, New York, 1986.
6. Mayergoyz, I. D., "Solution of the Nonlinear Poisson Equation of Semiconductor Device Theory," J. Appl. Phys., Vol. 59, No. 1, pp. 195-199, 1986.
7. Lee, C. C. and Palisoc, A. L., "Thermal Analysis of Semiconductor Devices," in Brebbia, C. A., ed. Topics in Boundary Element Research, SpringerVerlag: Berlin, Heidelberg, pp. 12-33, 1990.
8. Subramaniam-Sivanesan, S., "Gradient based Inverse Problem Methodology for Design Optimization in Electromagnetic Applications," Ph. D. dissertation, Marquette University, expected Dec., 1995.
9. Subramaniam, S., Arkadan, A. A. and Hoole, S. Ratnajeevan H., "Optimization of a Magnetic Pole Face using Linear Constraints to avoid Jagged Contours," IEEE Trans, on Magn., Vol. 30, No. 5, pp. 3455-3458, Sept. 1994.