Structural and electronic properties of ion-beam-prepared Al1-xFex samples

Journal of Physics Condensed Matter

Volumn 8, Issue 21, 1996, Pages 3843-3857

  Traverse, Agnès ^a   Belin Ferré, Esther ^b   Dankházi, Zoltân ^c   Mendoza Zélis, Luis ^d   Laborde, Olivier ^e   Portier, Richard ^f  

^a UNIVERSITÉ PARIS SACLAY   (France)

^b Université Pierre et Marie Curie   (France)

^c EÖTVÖS LORÁND UNIVERSITY   (Hungary)

^d UNIVERSIDAD NACIONAL DE LA PLATA   (Argentina)

^e LABORATOIRE DE CRISTALLOGRAPHIE   (France)

^f PSL RESEARCH UNIVERSITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BINARY ALLOYS; ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRON ENERGY LEVELS; ELECTRONIC PROPERTIES; ION BEAMS; IRON; IRRADIATION; MOSSBAUER SPECTROSCOPY; RUTHERFORD BACKSCATTERING SPECTROSCOPY; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY SPECTROSCOPY;

AMORPHOUS STATE; ATOMIC DISTRIBUTION; CRYSTALLINE ALLOYS; DEHYBRIDIZATION; ELECTRONIC DISTRIBUTION; ISOMER SHIFT VALUES; PSEUDO-GAP; QUASICRYSTALLINE STATE; STRUCTURAL PROPERTIES;

ALUMINUM ALLOYS;

EID: 0030147909     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/8/21/011     Document Type: Article

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