Computer-aided redesign of VLSI circuits for hot-carrier reliability

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 15, Issue 5, 1996, Pages 453-464

  Li, Ping Chung ^a   Hajj, Ibrahim N ^a  

^a ADVANCED MICRO DEVICES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; DEGRADATION; FAILURE ANALYSIS; HOT CARRIERS; INTEGRATED CIRCUIT LAYOUT; MOSFET DEVICES; RELIABILITY; SEMICONDUCTOR DEVICE MODELS; VLSI CIRCUITS;

COMPUTER AIDED REDESIGN; GLOBAL CIRCUIT DEGRADATION; HOT CARRIER EFFECTS; HOT CARRIER RELIABILITY; PERFORMANCE DEGRADATION;

COMPUTER AIDED DESIGN;

EID: 0030147857     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/43.506133     Document Type: Article

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