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Volumn 352-354, Issue , 1996, Pages 893-897
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Ageing of an organosiloxane deposit in a cold remote nitrogen plasma: XPS investigation
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Author keywords
Organosilicon; Scanning electron microscopy; X ray photoelectron spectroscopy
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Indexed keywords
AGING OF MATERIALS;
CHEMICAL BONDS;
DEPOSITION;
ETCHING;
MIXTURES;
MORPHOLOGY;
NITROGEN;
OXIDES;
PLASMA APPLICATIONS;
SILICONES;
SURFACE STRUCTURE;
X RAY PHOTOELECTRON SPECTROSCOPY;
COLD REMOTE NITROGEN PLASMA;
ORGANOSILOXANE DEPOSIT;
SURFACE COMPOSITION CHANGE;
THIN POLYMERIC FILMS;
PLASTIC FILMS;
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EID: 0030147855
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/0039-6028(95)01293-1 Document Type: Article |
Times cited : (3)
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References (15)
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