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Volumn 352-354, Issue , 1996, Pages 77-82

Surface relaxation of the (1010) face of wurtzite CdS

Author keywords

Cadmium sulphide; Density functional calculation; Semiconducting surfaces; Single crystal surfaces; Surface electronic phenomena; Surface relaxation and reconstruction

Indexed keywords

CALCULATIONS; CRYSTAL ATOMIC STRUCTURE; ELECTRONIC DENSITY OF STATES; LATTICE CONSTANTS; SEMICONDUCTING CADMIUM COMPOUNDS; SINGLE CRYSTALS; SURFACE STRUCTURE; SURFACES;

EID: 0030147848     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(95)01094-7     Document Type: Article
Times cited : (15)

References (22)
  • 2
    • 0002355675 scopus 로고
    • Oxidic semiconductor gas sensors
    • Ed. G. Sverbeglieri, Kluwer, Dordrecht
    • D. Kohl, Oxidic semiconductor gas sensors, in: Gas Sensors, Ed. G. Sverbeglieri (Kluwer, Dordrecht, 1992) pp. 43-88.
    • (1992) Gas Sensors , pp. 43-88
    • Kohl, D.1
  • 5
    • 0043177059 scopus 로고
    • Eds. D.A. King and D.P. Woodruff, Elsevier, Amsterdam, ch. 3
    • C.B. Duke, in: Surface Properties of Electronic Materials, Eds. D.A. King and D.P. Woodruff (Elsevier, Amsterdam, 1987) ch. 3, pp. 69-118.
    • (1987) Surface Properties of Electronic Materials , pp. 69-118
    • Duke, C.B.1
  • 6
  • 10
    • 0004494917 scopus 로고
    • Biosym Technologies, San Diego
    • DSolid User Guide (Biosym Technologies, San Diego, 1995).
    • (1995) DSolid User Guide


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.