In-plane displacement measurement using objective speckles in photorefractive two-beam coupling: Effect of multiple exposures

Optics Communications

Volumn 126, Issue 1-3, 1996, Pages 135-142

  Kumar, Arvind ^a   Kamra, Kanwal ^a   Singh, K ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY DELHI   (India)

Author keywords

[No Author keywords available]

Indexed keywords

BARIUM COMPOUNDS; CRYSTALS; DIFFRACTION GRATINGS; ELECTROOPTICAL EFFECTS; GEOMETRICAL OPTICS; LIGHT; LIGHT INTERFERENCE; LIGHT POLARIZATION; LIGHT REFRACTION; OPTICAL VARIABLES MEASUREMENT; REFRACTIVE INDEX;

BEAM FANNING; IN PLANE DISPLACEMENT MEASUREMENT; INTENSITY DISTRIBUTION; OBJECTIVE SPECKLES; PHOTOREFRACTIVE BARIUM TITANATE; TWO BEAM COUPLING;

SPECKLE;

EID: 0030147811     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/0030-4018(96)00024-7     Document Type: Article

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