Measurement and Modeling of N-Atom Behavior in the Afterglow of a Microwave Plasma

AIChE Journal

Volumn 42, Issue 5, 1996, Pages 1361-1370

  Wei, Ta Chin ^a   Collins, Lance R ^a   Phillips, Jonathan ^a  

^a The Pennsylvania State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; DIFFUSION; HEAT CONVECTION; MATHEMATICAL MODELS; NITROGEN; NUMERICAL METHODS; PLASMAS; THERMAL GRADIENTS; TITRATION;

CONCENTRATION FIELD; NITROGEN ATOM BEHAVIOR; NITROGEN ATOM FLUX; NITROGEN PLASMA AFTERGLOW; ONE DIMENSIONAL MASS CONTINUITY EQUATION; RADICAL CONCENTRATION; WALL RECOMBINATION;

PHOSPHORESCENCE;

EID: 0030147464     PISSN: 00011541     EISSN: None     Source Type: Journal    
DOI: 10.1002/aic.690420516     Document Type: Article

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