Microstructural characterization of ion implanted polycrystalline alumina

Journal de Physique III

Volumn 6, Issue 5, 1996, Pages 613-623

  Rahioui, A ^a   Esnouf, C ^a   Girardeau, T ^b   Benyagoub, A ^c  

^a UNIVERSITÉ DE LYON   (France)

^b CNRS   (France)

^c Lyon Medicine University   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; CRYSTAL ATOMIC STRUCTURE; CRYSTAL DEFECTS; CRYSTAL MICROSTRUCTURE; ION IMPLANTATION; POLYCRYSTALLINE MATERIALS; STRAIN; TRANSMISSION ELECTRON MICROSCOPY;

CUBIC STRUCTURE; DENSITY OF DEFECTS; X RAY ABSORPTION NEAR EDGE STRUCTURE;

ALUMINA;

EID: 0030146892     PISSN: 11554320     EISSN: None     Source Type: Journal    
DOI: 10.1051/jp3:1996144     Document Type: Article

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