Sparse-wavelength angle-multiplexed volume holographic memory system: Analysis and advances

Applied Optics

Volumn 35, Issue 14, 1996, Pages 2380-2388

  Campbell, Scott ^a,b   Yeh, Pochi ^a,c  

^a University of California   (United States)

^b LUCENT TECHNOLOGIES   (United States)

^c ROCKWELL SCIENCE CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIT ERROR RATE; CALCULATIONS; CHARGE COUPLED DEVICES; CROSSTALK; CRYSTALS; DIFFRACTION; HOLOGRAMS; HOLOGRAPHY; LITHIUM COMPOUNDS; MULTIPLEXING; SIGNAL TO NOISE RATIO;

BRAGG SELECTIVITY; LITHIUM NIOBATE; PHOTOREFRACTIVE MATERIALS; SPARSE WAVELENGTH ANGLE MULTIPLEXED VOLUME HOLOGRAPHIC SYSTEM; STORAGE DENSITY; WAVELENGTH;

OPTICAL DATA STORAGE;

EID: 0030146837     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.35.002380     Document Type: Article

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