A precision tester for studies of holographic optical storage materials and recording physics

Applied Optics

Volumn 35, Issue 14, 1996, Pages 2360-2374

  Bernal, M P ^a   Coufal, H ^a   Grygier, R K ^a   Hoffnagle, J A ^a   Jefferson, C M ^a   Macfarlane, R M ^a   Shelby, R M ^a   Sincerbox, G T ^a   Wimmer, P ^a   Wittmann, G ^a  

^a IBM ALMADEN RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATION; BIT ERROR RATE; CALCULATIONS; CAMERAS; CHARGE COUPLED DEVICES; FOURIER TRANSFORMS; HOLOGRAPHY; LITHIUM COMPOUNDS; MASKS; OPTICAL BEAM SPLITTERS; OPTICAL DATA STORAGE; OPTICAL TESTING;

BRAGG ANGLE STABILITY; CHROME ON GLASS MASK; HOLOGRAPHIC DATA STORAGE; HOLOGRAPHIC OPTICAL STORAGE TESTER; LITHIUM NIOBATE; PHOTOREFRACTIVE MATERIALS; PRECISION OPTICAL TESTER; RECORDING PHYSICS;

OPTICAL SYSTEMS;

EID: 0030146205     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.35.002360     Document Type: Article

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