Electrical transport properties and defect structure of SrFeCo0.5OX

Journal of the Electrochemical Society

Volumn 143, Issue 5, 1996, Pages 1736-1744

  Ma, U ^a   Balachandran, B ^a   Park, J H ^a   Segre, C U ^b  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b ILLINOIS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; ELECTRIC CONDUCTIVITY; ELECTROCHEMISTRY; ELECTRON TRANSITIONS; IONIC CONDUCTION; IONS; MATHEMATICAL MODELS; OXYGEN; POINT DEFECTS; PRESSURE EFFECTS; THERMAL EFFECTS;

DEFECT MODEL; ELECTROMOTIVE FORCE; ELECTRON BLOCKING METHOD; ELECTRON HOLES; GASTIGHT ELECTROCHEMICAL CELL; IONIC TRANSFERENCE NUMBER; OXYGEN PARTIAL PRESSURE; OXYGEN PERMEATION; SEMICONDUCTOR METAL SEMICONDUCTOR TRANSITION;

STRONTIUM COMPOUNDS;

EID: 0030146055     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1836709     Document Type: Article

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