Transmission electron microscopy study on the cross-sectional microstructure of an ion-nitriding layer

Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science

Volumn 27, Issue 5, 1996, Pages 1347-1352

  Xiaolei, X U ^a   Wang, Liang ^a   Zhiwei, Y U ^a   Hei, Zukun ^a  

^a DALIAN MARITIME UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; CRYSTALS; ELECTRON DIFFRACTION; FERRITES; MICROSTRUCTURE; NITRIDING; PHASE TRANSITIONS; SCANNING ELECTRON MICROSCOPY; STACKING FAULTS; STEEL; TRANSMISSION ELECTRON MICROSCOPY;

GUINIER-PRESTON ZONES; ION NITRIDING LAYER; LATTICE DISTORTION; TRANSFORMATION MECHANISM;

THIN FILMS;

EID: 0030146042     PISSN: 10735623     EISSN: None     Source Type: Journal    
DOI: 10.1007/bf02649871     Document Type: Article

References (6)

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