Bias-dependence of the appearance of scanning tunnelling microscope images of the GaAs(001)-(2 × 4) surface reconstruction

Surface Science

Volumn 352-354, Issue , 1996, Pages 724-729

  Jackson, M D ^a   Thornton, J M C ^a   Woolf, D A ^b   Weightman, P ^a  

^a UNIVERSITY OF LIVERPOOL   (United Kingdom)

^b CARDIFF UNIVERSITY   (United Kingdom)

Author keywords

Gallium arsenide; Scanning tunneling microscopy; Scanning tunneling spectroscopies; Surface defects

Indexed keywords

CHEMICAL BONDS; DEFECTS; ELECTRONIC STRUCTURE; SCANNING TUNNELING MICROSCOPY; SPECTROSCOPY; SURFACE STRUCTURE; SURFACE TREATMENT; SURFACES;

BIAS DEPENDENCE; SCANNING TUNNELING SPECTROSCOPY; SPECTROSCOPIC SPECTRUM; SURFACE DEFECTS; SURFACE RECONSTRUCTION; TOPOGRAPHY;

SEMICONDUCTING GALLIUM ARSENIDE;

EID: 0030145970     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(95)01248-6     Document Type: Article

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