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Volumn 32, Issue 6, 1995, Pages 505-508
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Evaluation of solid-state detectors for ultraviolet radiometric applications
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NPL
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Author keywords
[No Author keywords available]
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Indexed keywords
QUANTUM EFFICIENCY MEASUREMENT;
RECOMBINATION EFFECTS;
SILICON PHOTODIODES;
SOLAR BLIND;
SOLID STATE DETECTORS;
ULTRAVIOLET RADIOMETRIC APPLICATIONS;
ULTRAVIOLET SPECTRAL RESPONSIBILITY;
ELECTRON TRANSPORT PROPERTIES;
IONIZATION;
MONOCHROMATORS;
OPTICAL VARIABLES MEASUREMENT;
PHOTODIODES;
PHOTOSENSITIVITY;
QUANTUM EFFICIENCY;
RADIOMETRY;
SEMICONDUCTING GALLIUM COMPOUNDS;
SOLID STATE DEVICES;
ULTRAVIOLET RADIATION;
PHOTODETECTORS;
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EID: 0030145816
PISSN: 00261394
EISSN: None
Source Type: Journal
DOI: 10.1088/0026-1394/32/6/21 Document Type: Conference Paper |
Times cited : (14)
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References (3)
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