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Volumn 32, Issue 3 PART 2, 1996, Pages 958-961
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Performance limits in TDK technique by Monte Carlo simulation
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Author keywords
[No Author keywords available]
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Indexed keywords
BANDWIDTH;
CATHODE RAY OSCILLOSCOPES;
COMPUTER SIMULATION;
CORRELATION THEORY;
ELECTRIC GENERATORS;
ELECTROMAGNETIC FIELDS;
MEASUREMENT ERRORS;
MONTE CARLO METHODS;
RANDOM PROCESSES;
REFLECTOMETERS;
SPURIOUS SIGNAL NOISE;
TIME DOMAIN ANALYSIS;
DIELECTRIC UNDER TEST;
FREQUENCY DOMAIN DECONVOLUTION METHOD;
TIME DOMAIN DECONVOLUTION METHOD;
TIME DOMAIN REFLECTOMETRY;
DIELECTRIC MATERIALS;
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EID: 0030145786
PISSN: 00189464
EISSN: None
Source Type: Journal
DOI: 10.1109/20.497401 Document Type: Article |
Times cited : (18)
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References (10)
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