Precision-based optimization of multicomponent analysis in inductively coupled plasma mass spectrometry

Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 51, Issue 6 PART B, 1996, Pages 591-608

  Van Veen, E H ^a   Bosch, S ^a   De Loos Vollebregt, M T C ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Automatic interpretation; ICP MS; Interference correction; Precision; Survey analysis

Indexed keywords

CHARACTERIZATION; CHEMICAL ELEMENTS; COMPUTER SOFTWARE; DATA REDUCTION; DATABASE SYSTEMS; IONS; MAGNETIC MATERIALS; MATHEMATICAL MODELS; MATRIX ALGEBRA; OPTIMIZATION; PLASMA APPLICATIONS; STATISTICAL METHODS;

FLICKER AND ION SHOT NOISE; FULL RANGE MASS SCANS; INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY; MASS BIAS; MULTICOMPONENT ANALYSIS; PRECISION BASED OPTIMIZATION; RELATIVE STANDARD DEVIATION;

MASS SPECTROMETRY;

EID: 0030145398     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/0584-8547(95)01446-2     Document Type: Article

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