Logarithmic U(j) relationship in melt-textured growth YBa2Cu3O6+x by AC susceptibility measurements

Physica C: Superconductivity and its Applications

Volumn 262, Issue 1-2, 1996, Pages 127-134

  Qin, M J ^a   Ding, S Y ^a   Ren, C ^a   Yao, X X ^a   Fu, Y X ^b   Cai, C B ^b   Shi, T S ^b   Wang, G Y ^b  

^a NANJING UNIVERSITY   (China)

^b SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; CRYSTAL DEFECTS; CRYSTAL GROWTH; ELECTRIC VARIABLES MEASUREMENT; MAGNETIC PERMEABILITY; MAGNETIC RELAXATION; MATHEMATICAL TECHNIQUES; TRANSPORT PROPERTIES;

AC SUSCEPTIBILITY MEASUREMENTS; LOGARITHMIC RELATIONSHIP; MAGNETIC RELAXATION MEASUREMENTS; MELT TEXTURED GROWTH; PLANAR DEFECTS; VORTEX PINNING; YTTRIUM BARIUM CUPRATES;

HIGH TEMPERATURE SUPERCONDUCTORS;

EID: 0030143793     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/0921-4534(95)00381-9     Document Type: Article

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