Thickness determination of tabular silver bromide grains by atomic force microscopy and by dye adsorption

Journal of Imaging Science and Technology

Volumn 40, Issue 3, 1996, Pages 185-188

  Coll, Hans ^a   Fornalik, Jill E ^a  

^a EASTMAN KODAK COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; ATOMIC FORCE MICROSCOPY; DYES; GRAIN SIZE AND SHAPE; MOLECULES; NUMERICAL METHODS; SURFACES;

DYE ADSORPTION; GRAIN DIAMETER; GRAIN THICKNESS; PLATELETS; TABULAR SILVER BROMIDE GRAINS;

SILVER COMPOUNDS;

EID: 0030143567     PISSN: 10623701     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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