Deviations from Matthiessen's rule in continuous metal films

Thin Solid Films

Volumn 277, Issue 1-2, 1996, Pages 192-195

  Broitman, E ^a   Alonso, P ^a   Zimmerman, R ^a  

^a UNIVERSIDAD DE BUENOS AIRES   (Argentina)

Author keywords

Conductivity; Electrical properties and measurements; Electron scattering; Resistivity

Indexed keywords

CALCULATIONS; ELECTRIC CONDUCTIVITY; ELECTRON SCATTERING; FERMI LEVEL; GRAIN BOUNDARIES; MATHEMATICAL MODELS; THERMAL GRADIENTS; THERMOELECTRICITY;

BOLTZMANN TRANSPORT EQUATION; CONTINUOUS METAL FILMS; ELECTRON SURFACE SCATTERING; FUCHS-SONDHEIMER MODEL; MATTHIESSEN RULE PREDICTIONS; MAYADAS-SHATZKES MODEL; THERMOELECTRIC POWER; TOTAL FILM CONDUCTIVITY MODES;

METALLIC FILMS;

EID: 0030143440     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/0040-6090(95)08018-X     Document Type: Article

References (12)

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