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Volumn 79, Issue 5, 1996, Pages 1314-1318

Microstructural characterization of ZrO2/O′-SiAlON composites

Author keywords

[No Author keywords available]

Indexed keywords

SILICON ALUMINA OXINITRIDE;

EID: 0030143130     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.1996.tb08590.x     Document Type: Article
Times cited : (7)

References (20)
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    • S. Hirano, T. Hayashi, and T. Nakashima, "Characterisation of Pressureless Stinered β-SiAlON with Yttria-Doped Zirconia"; pp. 1123-29 in Advances in Ceramics, Vol. 24B, Science and Technology of Zirconia III. Edited by S. Somiya, N. Yamamoto, and H. Yanagida. American Ceramic Society, Westerville, OH, 1988.
    • (1988) Science and Technology of Zirconia III , vol.24 B , pp. 1123-1129
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  • 8
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    • H. G. Scott, "Phase Relationship in the Zirconia-Yttria System," J. Mater. Sci., 10, 1527-35 (1975).
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  • 14
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.