Growth and characterization of liquid-phase epitaxial Hg1-xCdxTe films

Thin Solid Films

Volumn 278, Issue 1-2, 1996, Pages 1-5

  Li, B ^a   Chen, X Q ^a   Chu, J H ^a   Cao, J Y ^a   Zhu, J Q ^a   Tang, D Y ^a  

^a SHANGHAI INSTITUTE OF TECHNICAL PHYSICS   (China)

Author keywords

Infrared spectroscopy; Liquid phase epitaxy; Mercury cadmium telluride; X ray diffraction

Indexed keywords

ANNEALING; CARRIER CONCENTRATION; EPITAXIAL GROWTH; FILM GROWTH; INFRARED SPECTROSCOPY; MERCURY COMPOUNDS; PRESSURE EFFECTS; SEMICONDUCTING CADMIUM COMPOUNDS; SEMICONDUCTING TELLURIUM COMPOUNDS; THERMAL EFFECTS; THIN FILMS; X RAY CRYSTALLOGRAPHY;

LIQUID PHASE EPITAXY; MERCURY CADMIUM TELLURIDE;

SEMICONDUCTING FILMS;

EID: 0030142608     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/0040-6090(95)08122-4     Document Type: Article

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