SCOPUS 정보 검색 플랫폼

Volumn 352-354, Issue , 1996, Pages 374-378

An EELS study of the effect of 2 keV Ar+ ion irradiation on thin C60 films

Author keywords

Electron energy loss spectroscopy; Fullerness; Ion irradiation

Indexed keywords

AMORPHIZATION; ARGON; CONTAMINATION; ELECTRON ENERGY LOSS SPECTROSCOPY; ION BOMBARDMENT; IONS; IRRADIATION; MOLECULES; THIN FILMS;

ION IRRADIATION;

FULLERENES;

EID: 0030142480 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/0039-6028(95)01163-3 Document Type: Article

Times cited : (1)

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