Structure and properties of Pd overlayers on Ru(100)

Surface Science

Volumn 352-354, Issue , 1996, Pages 41-45

  Poulston, S ^a,b   Tikhov, M ^a   Lambert, R M ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b UNIVERSITY OF READING   (United Kingdom)

Author keywords

Auger electron spectroscopy; Growth; Low energy electron diffraction (LEED); Low index single crystal surfaces; Palladium; Ruthenium; Single crystal epitaxy; Surface structure, morphology, roughness, and topography; Thermal desorption

Indexed keywords

AGGLOMERATION; ANNEALING; AUGER ELECTRON SPECTROSCOPY; CRYSTAL STRUCTURE; FILM GROWTH; HIGH TEMPERATURE EFFECTS; LOW ENERGY ELECTRON DIFFRACTION; RUTHENIUM; SURFACE PROPERTIES; SURFACE STRUCTURE; THERMODYNAMIC STABILITY; VAPOR DEPOSITION;

GROWTH MODE; LAYER BY LAYER TYPE GROWTH; LOW INDEX SINGLE CRYSTAL SURFACES; PALLADIUM FILMS; PALLADIUM OVERLAYERS; PSEUDOMORPHIC PATTERN; THERMAL DESORPTION SPECTROSCOPY;

PALLADIUM;

EID: 0030142443     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(95)01087-4     Document Type: Article

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