A high precision ATR study of surface plasmon mediated reflectance in noble metal films

Surface Science

Volumn 352-354, Issue , 1996, Pages 1043-1046

  Hoffmann, A ^a   Kroo N ^a   Lenkefi, Z ^a   Szentirmay, Z ^a  

^a WIGNER RESEARCH CENTRE FOR PHYSICS   (Hungary)

Author keywords

Dielectric phenomena; Gold; Grain boundaries; Plasmons; Polycrystalline thin films; Reflection spectroscopy; Silver; Surface roughening

Indexed keywords

EMISSION SPECTROSCOPY; EVAPORATION; GOLD; GONIOMETERS; LIGHT EMISSION; LIGHT REFLECTION; METALLIC FILMS; OPTICAL RESOLVING POWER; REFLECTOMETERS; RESONANCE; SILVER; SURFACE ROUGHNESS;

ANGULAR RESOLUTION; ATTENUATED TOTAL REFLECTION; BACKWARD RESONANCE LIGHT EMISSION; EXACT ROUGHNESS SPECTRUM; HELIUM NEON LIGHT SOURCES; KROGER-KRETSCHMANN FORMULAE; LOCK IN DETECTION TECHNIQUE; SURFACE PLASMON MEDIATED REFLECTANCE; TWIN GONIOMETER; YTTRIUM ALUMINUM GARNET LASER LIGHT SOURCES;

SURFACE STRUCTURE;

EID: 0030142348     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(95)01324-5     Document Type: Article

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