Electrochemical characterization of thin films based on new silicon-containing aromatic poly(1,3,4-oxadiazole)s

Polymers for Advanced Technologies

Volumn 7, Issue 5-6, 1996, Pages 514-518

  Schulz, Burkhard ^a   Janietz, Silvia ^b   Sava, Ion ^c   Bruma, Maria ^c  

^a UNIVERSITY OF POTSDAM   (Germany)

^b FRAUNHOFER INSTITUTE FOR APPLIED POLYMER RESEARCH   (Germany)

^c PETRU PONI INSTITUTE OF MACROMOLECULAR CHEMISTRY   (Romania)

Author keywords

Electrochemical properties; Silicon containing poly(1,3,4 oxadiazole)s; Thin films

Indexed keywords

AROMATIC POLYMERS; CHARACTERIZATION; DECOMPOSITION; ELECTROCHEMISTRY; IONS; MACROMOLECULES; MOLECULAR STRUCTURE; ORGANIC SOLVENTS; OXIDATION; REDUCTION; SILICON;

DIPPING METHOD; ELECTROCHEMICAL BEHAVIOR; ELECTRON CONJUGATION; RADICAL ANIONS; RADICAL CATIONS; REDUCTION POTENTIAL; SILICON CONTAINING AROMATIC POLYOXADIAZOLE; SPIN COATING TECHNIQUE; TETRAPHENYL SILANE UNITS;

PLASTIC FILMS;

EID: 0030142237     PISSN: 10427147     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1099-1581(199605)7:5/6<514::aid-pat538>3.0.co;2-9     Document Type: Article

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