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Volumn 352-354, Issue , 1996, Pages 855-860

Electronic and surfactant effects of As interlayers at Ag/InP(110) interfaces

Author keywords

Arsenic; Growth; Indium phosphide; Low index single crystal surfaces; Metal semiconductor interfaces; Schottky barrier; Silver; Soft X ray photoelectron spectroscopy

Indexed keywords

ARSENIC; CHEMICAL BONDS; CRYSTAL GROWTH; INTERFACES (MATERIALS); MONOLAYERS; PHOTOEMISSION; SCHOTTKY BARRIER DIODES; SEMICONDUCTING INDIUM PHOSPHIDE; SILVER; SURFACE ACTIVE AGENTS; SURFACES; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0030141536     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(95)01287-7     Document Type: Article
Times cited : (9)

References (22)
  • 4
    • 0001427282 scopus 로고
    • J.R. Waldrop, J. Vac. Sci. Technol. B 3 (1985) 1197; Appl. Phys. Lett. 47 (1985) 1301.
    • (1985) Appl. Phys. Lett. , vol.47 , pp. 1301


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.