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Volumn 352-354, Issue , 1996, Pages 855-860
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Electronic and surfactant effects of As interlayers at Ag/InP(110) interfaces
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Author keywords
Arsenic; Growth; Indium phosphide; Low index single crystal surfaces; Metal semiconductor interfaces; Schottky barrier; Silver; Soft X ray photoelectron spectroscopy
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Indexed keywords
ARSENIC;
CHEMICAL BONDS;
CRYSTAL GROWTH;
INTERFACES (MATERIALS);
MONOLAYERS;
PHOTOEMISSION;
SCHOTTKY BARRIER DIODES;
SEMICONDUCTING INDIUM PHOSPHIDE;
SILVER;
SURFACE ACTIVE AGENTS;
SURFACES;
X RAY PHOTOELECTRON SPECTROSCOPY;
GROWTH MODE;
INTERFACE REACTION;
INTERLAYERS;
INTERMEDIATE ARSENIC MONOLAYER;
SURFACE STRUCTURE;
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EID: 0030141536
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/0039-6028(95)01287-7 Document Type: Article |
Times cited : (9)
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References (22)
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