Reactive and unreactive interfaces studied by means of metastable deexcitation spectroscopy

Surface Science

Volumn 352-354, Issue , 1996, Pages 383-386

  Pasquali, L ^a   Fantini, P ^a   Nannarone, S ^a   Canepa, M ^b   Mattera, L ^b  

^a UNIVERSITY OF MODENA AND REGGIO EMILIA   (Italy)

^b UNIVERSITY OF GENOA   (Italy)

Author keywords

Angle resolved photoemission; Antimony; Atom solid scattering and diffraction inelastic; Crystalline amorphous interfaces; Gallium arsenide; Metal semiconductor interfaces; Ytterbium

Indexed keywords

AMORPHOUS MATERIALS; ANTIMONY; CHEMICAL BONDS; CRYSTAL ATOMIC STRUCTURE; CRYSTALLINE MATERIALS; DIFFRACTION; ELECTRONIC STRUCTURE; PHOTOEMISSION; SCATTERING; SEMICONDUCTING GALLIUM ARSENIDE; SPECTROSCOPY; YTTERBIUM;

ANGLE RESOLVED PHOTOEMISSION; ATOM SOLID DIFFRACTION; ATOM SOLID SCATTERING; INTERFACE FORMATION; METASTABLE DEEXCITATION SPECTROSCOPY;

INTERFACES (MATERIALS);

EID: 0030141253     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(95)01165-X     Document Type: Article

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