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Journal of the Mechanics and Physics of Solids

Volumn 44, Issue 5, 1996, Pages 723-736

Some elementary connections between curvature and mismatch strain in compositionally graded thin films

(1) Freund, L B a

a Brown University (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION; FILM GROWTH; GRADING; LATTICE CONSTANTS; METALLIC FILMS; NUCLEATION; SEMICONDUCTOR MATERIALS; STRAIN; STRUCTURE (COMPOSITION); SURFACES; THICKNESS MEASUREMENT;

FILM THICKNESS; ISLAND FORMATION; LOCAL STRAIN CONDITIONS; STRAIN DISTRIBUTION; THROUGH THE THICKNESS VARIATIONS;

THIN FILMS;

EID: 0030141232 PISSN: 00225096 EISSN: None Source Type: Journal
DOI: 10.1016/0022-5096(96)00008-7 Document Type: Article

Times cited : (110)

References (10)

1
- 0004993341
- Residual stresses
- American Society for Metals, Cleveland
- Baldwin, W. M., Boardman, H. C., Halgren, J. A., Mattson, R. L. and McKloskey, A. S. (1955) Residual Stresses. Metals Handbook (Supplement), pp. 89-96. American Society for Metals, Cleveland.
- (1955) Metals Handbook , Issue.SUPPL. , pp. 89-96
- Baldwin, W.M.¹ Boardman, H.C.² Halgren, J.A.³ Mattson, R.L.⁴ McKloskey, A.S.⁵

2
- 0003988629
- Wiley, New York
- Boley, B. and Weiner, J. H. (1960) Theory of Thermal Stresses, p. 277. Wiley, New York.
- (1960) Theory of Thermal Stresses , pp. 277
- Boley, B.¹ Weiner, J.H.²

3
- 0000929676
- The determination of the elastic field of an ellipsoidal inclusion, and related problems
- Eshelby, J. D. (1957) The determination of the elastic field of an ellipsoidal inclusion, and related problems. Proc. Royal Soc. (London) A252, 376-396.
- (1957) Proc. Royal Soc. (London) , vol.A252 , pp. 376-396
- Eshelby, J.D.¹

4
- 0002429638
- Principles and applications of wafer curvature techniques for stress measurements in thin films
- (ed. J. C. Bravman, W. D. Nix, D. M. Barnett and D. A. Smith), Materials Research Society, Pittsburgh
- Flinn, P. A. (1989) Principles and applications of wafer curvature techniques for stress measurements in thin films. Thin Films: Stresses and Mechanical Properties (ed. J. C. Bravman, W. D. Nix, D. M. Barnett and D. A. Smith), pp. 41-51. Materials Research Society, Pittsburgh.
- (1989) Thin Films: Stresses and Mechanical Properties , pp. 41-51
- Flinn, P.A.¹

5
- 0027656416
- The stress distribution and curvature of a general compositionally graded semiconductor layer
- Freund, L. B. (1993) The stress distribution and curvature of a general compositionally graded semiconductor layer. J. Crystal Growth 132, 341-344.
- (1993) J. Crystal Growth , vol.132 , pp. 341-344
- Freund, L.B.¹

6
- 0010180738
- Residual stresses in graded thick coatings
- Kroupa, F., Knesl. Z. and Valach, J. (1993) Residual stresses in graded thick coatings. Acta Technica CSAV 38, 29-74.
- (1993) Acta Technica CSAV , vol.38 , pp. 29-74
- Kroupa, F.¹ Knesl, Z.² Valach, J.³

7
- 0026224406
- xAs layers on GaAs seeds
- xAs layers on GaAs seeds. J. Crystal Growth 113, 477-484.
- (1991) J. Crystal Growth , vol.113 , pp. 477-484
- Nakajima, K.¹

8
- 0026895517
- Calculation of stresses in GaAs/Si strained heterostructures
- Nakajima, K. (1992) Calculation of stresses in GaAs/Si strained heterostructures. J. Crystal Growth 121, 278-296.
- (1992) J. Crystal Growth , vol.121 , pp. 278-296
- Nakajima, K.¹

9
- 0030147835
- Substrate curvature resulting from the capillary forces of a liquid drop
- Spaepen, F. (1996) Substrate curvature resulting from the capillary forces of a liquid drop. J. Mech. Phys. Solids 44, 675-681.
- (1996) J. Mech. Phys. Solids , vol.44 , pp. 675-681
- Spaepen, F.¹

10
- 0000073841
- The tension of metallic films deposited by electrolysis
- Stoney, G. G. (1909) The tension of metallic films deposited by electrolysis. Proc. Royal Soc. (London) A82, 172-175.
- (1909) Proc. Royal Soc. (London) , vol.A82 , pp. 172-175
- Stoney, G.G.¹

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