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Journal of the Mechanics and Physics of Solids

Volumn 44, Issue 5, 1996, Pages 723-736

Some elementary connections between curvature and mismatch strain in compositionally graded thin films

(1) Freund, L B a

a Brown University (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION; FILM GROWTH; GRADING; LATTICE CONSTANTS; METALLIC FILMS; NUCLEATION; SEMICONDUCTOR MATERIALS; STRAIN; STRUCTURE (COMPOSITION); SURFACES; THICKNESS MEASUREMENT;

FILM THICKNESS; ISLAND FORMATION; LOCAL STRAIN CONDITIONS; STRAIN DISTRIBUTION; THROUGH THE THICKNESS VARIATIONS;

THIN FILMS;

EID: 0030141232 PISSN: 00225096 EISSN: None Source Type: Journal
DOI: 10.1016/0022-5096(96)00008-7 Document Type: Article

Times cited : (109)

References (10)

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- Eshelby, J.D.¹

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- (1989) Thin Films: Stresses and Mechanical Properties , pp. 41-51
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6
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