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Volumn 5, Issue 2, 1996, Pages 260-264
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Dominant SiHx radicals in electron cyclotron resonance plasma CVD
a
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Author keywords
[No Author keywords available]
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Indexed keywords
CHEMICAL VAPOR DEPOSITION;
COMPUTER SIMULATION;
ELECTRON CYCLOTRON RESONANCE;
FILM GROWTH;
FILM PREPARATION;
MONTE CARLO METHODS;
PLASMA APPLICATIONS;
PROBABILITY;
SEMICONDUCTING FILMS;
SEMICONDUCTOR PLASMAS;
SILANES;
SILICON;
ELECTRON CYCLOTRON RESONANCE PLASMA CHEMICAL VAPOR DEPOSITION;
PARTICLE BOMBARDMENT;
PLASMA SOURCES;
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EID: 0030134588
PISSN: 09630252
EISSN: None
Source Type: Journal
DOI: 10.1088/0963-0252/5/2/020 Document Type: Article |
Times cited : (1)
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References (21)
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