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Volumn 8, Issue 4, 1996, Pages 509-511

Practical approach to design and fabrication of antireflection coatings for semiconductor optical amplifiers

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT AMPLIFIERS; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DEVICE STRUCTURES; SEMICONDUCTOR LASERS; WAVEGUIDES;

EID: 0030130252     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/68.491209     Document Type: Article
Times cited : (4)

References (7)
  • 4
    • 0026852948 scopus 로고
    • Optimal AR coating for optical waveguide devices
    • Apr.
    • W. Hellmich and P. Deimel, "Optimal AR coating for optical waveguide devices," J. Lightwave Technol., vol. 10, no. 4, pp. 469-476, Apr. 1992.
    • (1992) J. Lightwave Technol. , vol.10 , Issue.4 , pp. 469-476
    • Hellmich, W.1    Deimel, P.2
  • 5
    • 84975563123 scopus 로고
    • Reflectivity of multidielectric coatings deposited on the end facet of a weakly guiding dielectric slab waveguide
    • Nov.
    • C. Vassallo, "Reflectivity of multidielectric coatings deposited on the end facet of a weakly guiding dielectric slab waveguide," J. Optical Soc. Amer., vol. 5, no. 11, pp. 1918-1928, Nov. 1988.
    • (1988) J. Optical Soc. Amer. , vol.5 , Issue.11 , pp. 1918-1928
    • Vassallo, C.1
  • 6
    • 0024611740 scopus 로고
    • Single layer antireflection coating of semiconductor lasers: Polarization properties and influence of the laser structure
    • Feb.
    • L. Atternäs and L. Thylén, "Single layer antireflection coating of semiconductor lasers: Polarization properties and influence of the laser structure," J. Lightwave Technol., vol. 7, no. 2, pp. 426-430, Feb. 1989.
    • (1989) J. Lightwave Technol. , vol.7 , Issue.2 , pp. 426-430
    • Atternäs, L.1    Thylén, L.2
  • 7
    • 0029273679 scopus 로고
    • Measurement of the facet modal reflectivity spectrum in high quality semiconductor traveling wave amplifiers
    • Mar.
    • S. A. Merritt, C. Dauga, S. H. Fox, I.-F. Wu, and M. Dagenais, "Measurement of the facet modal reflectivity spectrum in high quality semiconductor traveling wave amplifiers," J. Lightwave Technol., vol. 13, no. 3, pp. 430-433, Mar. 1995.
    • (1995) J. Lightwave Technol. , vol.13 , Issue.3 , pp. 430-433
    • Merritt, S.A.1    Dauga, C.2    Fox, S.H.3    Wu, I.-F.4    Dagenais, M.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.