The impact of multiplexing on the dynamic requirements of analog-to-digital converters

IEEE Transactions on Instrumentation and Measurement

Volumn 45, Issue 2, 1996, Pages 616-620

  Sobering, Tim J ^a,b   Rex Kay, R ^b  

^a IEEE

^b SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; DATA ACQUISITION; MULTIPLEXING EQUIPMENT; NYQUIST DIAGRAMS; PHOTODIODES; STEP RESPONSE; SYSTEMS ANALYSIS; TIME DIVISION MULTIPLEXING; TRANSFER FUNCTIONS;

NYQUIST LIMITED SYSTEM; SAMPLING THEOREM; SLEW RATES; VOLTAGE MULTIPLEXING;

ANALOG TO DIGITAL CONVERSION;

EID: 0030129978     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.492798     Document Type: Article

References (5)

1. Hewlett Packard Corporation, "Dynamic performance testing of A to D converters," Product Note 5180A-2.
2. D. W. Doerfler, "Techniques for testing a 15-bit data acquisition system," SAND85-7250, Sandia National Laboratories, 1985.
3. M. J. Dernier, "Time-domain techniques enhance testing of high-speed ADC's,"EDN, pp. 115-120, Mar. 30, 1992.
4. T. E. Linnenbrink, "Effective bits: Is that all there is?"IEEE Trans. Instrum. Meas., vol. IM-33, no. 3, pp. 184-187, Sept. 1984.
5. C. Sabolis, "Seeing is believing, A/D converters make the difference in imaging applications," Photonics Spectra, pp. 119-126, Oct. 1993.