Analysis of optical surfaces by means of surface plasmon spectroscopy

IEEE Transactions on Instrumentation and Measurement

Volumn 45, Issue 2, 1996, Pages 399-405

  Fontana, Eduardo ^a  

^a FEDERAL UNIVERSITY OF PERNAMBUCO   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC FIELDS; FOURIER TRANSFORMS; LIGHT SCATTERING; OPTICAL DEVICES; PERMITTIVITY; REFRACTIVE INDEX; SEMICONDUCTOR DEVICES; SENSITIVITY ANALYSIS; SURFACE ROUGHNESS; THIN FILMS;

SURFACE PLASMON OSCILLATIONS; SURFACE PLASMON SPECTROSCOPY; TUNNELING ELECTRON MICROSCOPE;

OPTICAL VARIABLES MEASUREMENT;

EID: 0030129977     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.492755     Document Type: Article

References (9)

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