Cyclic voltammetry at mercury microelectrodes. Effects of mercury thickness and scan rate

Electrochimica Acta

Volumn 41, Issue 6, 1996, Pages 811-818

  Baldo, M Antonietta ^a   Daniele, Salvatore ^a   Mazzocchin, Gian A ^a  

^a CA' FOSCARI UNIVERSITY OF VENICE   (Italy)

Author keywords

Amalgam; Cyclic voltammetry; Mercury microelectrode; Thickness

Indexed keywords

CADMIUM; DIFFUSION IN SOLIDS; ELECTRODEPOSITION; INTERMETALLICS; MERCURY AMALGAMS; MICROELECTRODES; PLATINUM; SOLUTIONS; THIN FILMS;

AMALGAM; CATHODIC ANODIC PATTERN; CYCLIC VOLTAMMOGRAMS; MERCURY MICROELECTRODES; MERCURY THICKNESS;

CYCLIC VOLTAMMETRY;

EID: 0030129375     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/0013-4686(95)00367-3     Document Type: Article

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