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Volumn 125, Issue 1-3, 1996, Pages 158-167
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Semiconductor laser confocal and interference microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
COHERENT LIGHT;
FEEDBACK;
IMAGING SYSTEMS;
INTERFEROMETRY;
LIGHT INTERFERENCE;
LIGHT MODULATION;
MICROSCOPES;
OPTICAL FIBERS;
OPTICAL MICROSCOPY;
SURFACES;
THREE DIMENSIONAL;
COHERENT LENGTH;
CONFOCAL IMAGING;
CONFOCAL SIGNAL;
INFERENCE MICROSCOPY;
INJECTION CURRENT;
LASER WAVELENGTH;
LOCK IN DEMODULATION;
PATH INFERENCE;
PHASE IMAGING SYSTEMS;
SURFACE PROFILOMETRY;
SEMICONDUCTOR LASERS;
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EID: 0030128364
PISSN: 00304018
EISSN: None
Source Type: Journal
DOI: 10.1016/0030-4018(95)00701-6 Document Type: Article |
Times cited : (13)
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References (16)
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