Programmable liquid crystal waveplates in ellipsometric measurements

Measurement Science and Technology

Volumn 7, Issue 4, 1996, Pages 505-510

  Carey, R ^a   Gago Sandoval, P A ^a   Newman, D M ^a   Thomas, B W J ^a  

^a Faculty of Engineering and Computing   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL COMPLEXITY; ELECTROOPTICAL DEVICES; ELLIPSOMETRY; LIGHT REFLECTION; OPTICAL VARIABLES MEASUREMENT; PHASE MODULATION; POLARIZATION; SPURIOUS SIGNAL NOISE;

LOW VOLTAGE ELECTRICAL DRIVE SIGNALS; PROGRAMMABLE LIQUID CRYSTAL; PROGRAMMABLE RETARDANCES; WAVEPLATES;

NEMATIC LIQUID CRYSTALS;

EID: 0030128224     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/7/4/006     Document Type: Article

References (9)

1. Azzam RMA and Bashara N M 1977 Ellipsometry and Polarised Light (Amsterdam: North Holland)
2. Minor R S 1903 Ann. Phys., Lpz. 10 581
3. Carey R, Newman D M, Snelling J P and Thomas B W J 1994 J. Appl. Phys. 75 7807-9
4. Carey R, Newman D M, Snelling J P and Thomas B W J 1995 Thin Solid Films 259 75-8
5. Carey R, Jenniches H, Newman D M and Thomas B W J 1993 J. Magn. Soc. Japan 17 (S1) 290-3
6. Takanashi T, Watanabe J, Kido G and Fujimori H 1990 IEEE Trans J. Magn. Japan 5(11) 1009-15
7. Drews U and Jaumann J 1969 Z. Angew. Phys. 26 48
8. Carey R, Bouvier P, Newman D M and Thomas B W J 1995 Paper FP-22 Intermag '95 (San Antonio, Texas, USA) April 18-21 1995
9. Berkowitz A E and Meiklejohn WH 1974 GE Technical Information 74CRD286 November 1974, (General Electric Company, Schenectary, NY 12301)